ultraviolet visible diffuse reflectance spectroscopy  (JASCO Inc)

Journal: Scientific Reports

Article Title: Mechanistic and electrochemical investigation of solar light driven organic pollutant degradation using SrFe 12 O 19 /NiO Z-scheme heterojunctions

doi: 10.1038/s41598-026-39997-0

Figure Lengend Snippet: ( a ) UV–Vis absorbance; ( b ) (αhν) 2 versus hν plots of SFO, NiO, and SFO/NiO photocatalysts.

Article Snippet: The optical properties and band gaps of the NMs were assessed using a UV-Vis diffuse reflectance spectrophotometer (UV-Vis DRS, JASCO, and Japan).The residual dye concentration was measured using a colorimetric method following the APHA guidelines.

Techniques:

Journal: Journal of the American Chemical Society

Article Title: Elucidating the Origin of Hidden Limitations in Ru-Complex/Ag/Polymeric Carbon Nitride Hybrid Photocatalysts for Visible-Light CO 2 Reduction

doi: 10.1021/jacs.5c21374

Figure Lengend Snippet: (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

Article Snippet: The prepared materials were characterized by nuclear magnetic resonance (NMR) (JEOL ECA400II) ( 1 H; 400 MHz and 31 P; 168 MHz), X-ray diffraction (XRD) (MiniFlex600, Rigaku; Cu–Kα radiation), UV–vis diffuse-reflectance spectroscopy (DRS) (V-565, Jasco), and Fourier transform infrared (FT-IR) spectroscopy (FT-IR-610, Jasco).

Techniques: Irradiation, Filtration

Journal: Nature Communications

Article Title: Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting

doi: 10.1038/s41467-026-68848-9

Figure Lengend Snippet: a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

Article Snippet: UV–visible diffuse reflectance spectroscopy (DRS) data were recorded using a UV-visible spectrometer (V-670, JASCO system).

Techniques: Electron Microscopy, Synthesized, Transmission Assay, Spectroscopy